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Multi-layer co-extruded conductive bag


The charge carriers in conductive thin films experience scattering at surfaces and interfaces during transport. When the film thickness becomes comparable to the electron mean free path, the effects of these surfaces and interfaces become significant; this phenomenon is known as the size effect in thin films. It effectively reduces the carrier mean free path, resulting in lower electrical conductivity compared to bulk materials of the same composition. Due to imperfect fabrication processes, thin films typically exhibit relatively high defect concentrations, including impurities, vacancies, interstitial atoms, dislocations, grain boundaries, as well as surface and interface adsorption and segregation. Our company’s conductive‑film technology addresses these defects, thereby enhancing the performance of such films.

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Multi-layer co-extruded conductive bag


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